DIO 565 General Features:
• Each flaw detector may be used with a single or dual ultrasonic probe for flaw detection and thickness measurements
• The family has several members, the features of which differ according to properties of the material under test (see the overview above)
• The received signals are digitally processed
• Each instrument is equipped with a memory card and may be connected to a PC
• Each flaw detector has three gates with alarm facilities
• AVG and DAC curves for flaw size evaluation
• Easy calibration for FBH, SDH and BWE
• Echo height processing as averaging, peak value freezing
• Freeze peak value
• Adjustable time base with zoom, interface triggering
• Analogue filtering for signal/noise ratio for enhancement
• 2-D display / B-scan
• Real time clock
• Voice recording
• Recording of all set-up parameters
• Low power mode
• Mains or battery supply
• Attenuation measurement
• 3 gates (gate 3 with adjustable gain)
• Averaging
• FIR filter
• Burst pulser